SN74BCT8374ADW
Framleiðandi Vöru númer:

SN74BCT8374ADW

Product Overview

Framleiðandi:

Texas Instruments

Völu númer:

SN74BCT8374ADW-DG

Lýsing:

IC SCAN TEST DEVICE W/FF 24-SOIC
Mikilvægar upplýsingar:
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

Birgðir:

75 Stk Nýtt Upprunalegt Á Lager
1718307
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Magn
Minimum 1
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Við munum hafa samband við þig innan 24 klukkustunda
STILLTA

SN74BCT8374ADW Tæknilegar forskriftir

Flokkur
Rökhugsun, Sérstök rökfræði
Framleiðandi
Texas Instruments
Pakkning
Tube
Röð
74BCT
Staða vöru
Active
Rökfræði gerð
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Framboð Voltage
4.5V ~ 5.5V
Fjöldi bita
8
Hitastig rekstrar
0°C ~ 70°C
Gerð uppsetningar
Surface Mount
Pakki / hulstur
24-SOIC (0.295", 7.50mm Width)
Birgir tæki pakki
24-SOIC
Grunnvörunúmer
74BCT8374

Gagnaablað & Skjöl

Gagnablöð
SN54/74BCT8374A

Aukainformation

Venjulegur pakki
25
Önnur nöfn
SN74BCT8374ADWE4-DG
SN74BCT8374ADWE4
-SN74BCT8374ADW-NDR
SN74BCT8374ADWG4
SN74BCT8374ADWG4-DG
296-33849-5
SN74BCT8374ADW-DG

Umhverfis- og útflutningsflokkun

RoHS staða
ROHS3 Compliant
Rakanæmi (MSL)
1 (Unlimited)
REACH staða
REACH Unaffected
ECCN
EAR99
HTSUS
8542.39.0001
DIGI vottun
certification_01
certification_02
certification_03
certification_04
cr
certification_015
certification_08
esd
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